Pascal and Francis Bibliographic Databases

Help

Search results

Your search

au.\*:("GENEROSI, R")

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 15 of 15

  • Page / 1
Export

Selection :

  • and

AUTOMATIC TEMPERATURE COMPENSATING APPARATUS FOR MEASUREMENT OF THIN FILMS DURING DEPOSITIONGENEROSI R; MIRIAMETRO A.1982; REV. SCI. INSTRUM.; ISSN 0034-6748; USA; DA. 1982; VOL. 53; NO 9; PP. 1470-1471; BIBL. 7 REF.Article

MICROAUTOMATIC DATA ACQUISITION SYSTEMGENEROSI R; SELCI S.1981; REV. SCI. INSTRUM.; ISSN 0034-6748; USA; DA. 1981; VOL. 52; NO 6; PP. 933-935Article

A portable power supply for sputter-ion pumpsBARCHESI, C; GENEROSI, R; RINALDI, M et al.Vacuum. 1993, Vol 44, Num 8, pp 815-817, issn 0042-207XArticle

PC-based digital apparatus with temperature compensation for measurement of thin films during depositionGENEROSI, R; BARCHESI, C; LUCE, M et al.Review of scientific instruments. 1993, Vol 64, Num 10, pp 2952-2953, issn 0034-6748Article

Optical nanospectroscopy study of ion-implanted silicon and biological growth mediumCRICENTI, A; MAROCCHI, V; AGGARWAL, I. D et al.Journal of alloys and compounds. 2004, Vol 362, pp 21-25, issn 0925-8388, 5 p.Conference Paper

Shaping of tungsten tips for scanning tunneling microscope = Mise en forme de pointes de tungstène pour la microscopie tunnel à balayageCRICENTI, A; SELCI, S; GENEROSI, R et al.Solid state communications. 1989, Vol 70, Num 9, pp 897-898, issn 0038-1098Article

Optical nanospectroscopy applications in material scienceCRICENTI, A; LONGO, G; SANGHERA, J. S et al.Applied surface science. 2004, Vol 234, Num 1-4, pp 374-386, issn 0169-4332, 13 p.Conference Paper

Photoemission analysis of chemical differences between the membrane and cytoplasm of neuronal cellsLORUSSO, G. F; DE STASIO, G; CASALBORE, P et al.Journal of physics. D, Applied physics (Print). 1997, Vol 30, Num 12, pp 1794-1798, issn 0022-3727Article

AFM and SNOM characterization of carboxylic acid terminated silicon and silicon nitride surfacesCRICENTI, A; LONGO, G; MILLER, J. K et al.Surface science. 2003, Vol 544, Num 1, pp 51-57, issn 0039-6028, 7 p.Article

Near-field imaging of the photocurrent on a patterned Au/GaAs interface with various wavelengths and biasDAVY, S; SPAJER, M; ALMEIDA, J et al.EPJ. Applied physics (Print). 1999, Vol 5, Num 3, pp 283-288, issn 1286-0042Article

Spectroscopic infrared scanning near-field optical microscopy (IR-SNOM)VOBORNIK, D; MARGARITONDO, G; RIETI, S et al.Journal of alloys and compounds. 2005, Vol 401, Num 1-2, pp 80-85, issn 0925-8388, 6 p.Conference Paper

A study of physical properties and gas-surface interaction of vanadium oxide thin filmsRELLA, R; SICILIANO, P; CRICENTI, A et al.Thin solid films. 1999, Vol 349, Num 1-2, pp 254-259, issn 0040-6090Article

Neurone decapping characterization by atomic force microscopy : a topological systematic analysisDE STASIO, G; CRICENTI, A; GENEROSI, R et al.Neuroreport (Oxford). 1995, Vol 7, Num 1, pp 65-68, issn 0959-4965Article

Molecular structure of DNA by scanning tunneling microscopyCRICENTI, A; SELCI, S; FELICI, A. C et al.Science (Washington, D.C.). 1989, Vol 245, Num 4923, pp 1226-1227, issn 0036-8075Article

A graphite study with a new air operating scanning tunnelling microscopeCRICENTI, A; SELCI, S; GENEROSI, R et al.Journal of microscopy (Print). 1988, Num 152, pp 789-794, issn 0022-2720, 3Article

  • Page / 1